Technical Note
자료실 Technical Note
| [논문게재] 배석주_Fault classification via energy based features of two-dimensional image data | ||||||||||||||||||
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| 이전글 | [논문게재] 배석주_A random-effect gamma process model with random initial degradation for accelerated destructive degradation testing data | |||||||||||||||||
| 다음글 | [논문게재] 배석주_Equivalent circuit simulated deep network architecture and transfer learning for remaining useful life prediction of lithium-ion batteries | |||||||||||||||||